近期研究 Recent Research
A Deep Neural Network for Fast Confocal Laser Scanning Microscopy Imaging Recovery Algorithm from Random Undersampling Measurements
In this work, an end-to-end non-iteration-based deep residual convolutional neural network compressive sensing reconstruction (DRCNN-CSR) framework is proposed. Proposed recovery model takes advantage of residual learning to make our model deeper and be optimized within reasonable time. Furthermore, the non-iterative feature of the proposed model greatly reduces the computation time, and an end-to-end reconstruction of the whole image. Moreover, we also propose an adaptive undersampling rate strategy to adjust the under-sampling rate in different local areas to address the uneven sample information density problem. Finally, the experimental results show that our proposed framework is robust and feasible for fast CLSM imaging application.
Using a Spatial Entropy based on CLSM Image for AFM Path Planning of ROI to Achieve High-speed and High-precision Image
Hybrid scanning microscope by integrating Atomic-Force Microscope (AFM) and Confocal Laser Scanning Microscope (CLSM) is widely used in measurement. We develop a cooperative scanning strategy to achieve high-speed and high-precision image, simultaneously. First, we obtain a coarse 3D image by CLSM. After that, we based on calculating spatial entropy of CLSM image to obtain regions of interest (ROI) in AFM for finely scanning. Finally, we integrate the scanning results from CLSM and AFM to obtain a hybrid image. The experimental results show it saves total scanning time, while keeping the resolution which is slightly inferior to traditional AFM.
研究概況 Introduction
新型原子力顯微鏡之設計與控制
Design and Control of Novel Atomic Force Microscopies
Design and Control of Novel Atomic Force Microscopies
奈米科技 (Nanotechnology)是目前全球眾所矚目的尖端科技之一,此項技術的開發將牽動各國的經濟競爭力,奈米科技的應用非常廣泛,包括醫療藥學、材料科學、生物檢測、半導體製程等科技領域的發展。在當前的奈米科技量測技術之中,由於原子力顯微鏡(Atomic Force Microscopy, AFM)可以直接量測各種導體與非導體樣本,且不受任何環境的限制,皆可達到奈米等級的量測能力,使得此技術已是國內目前極為重要的奈米量測工具之一。
有鑑於此、本研究團隊目前專注於AFM系統與技術之開發,目前已成功實現出多套自組式AFM系統 :
Nano-technology is an important research area in 21st century. There are many relevant applications in civil industry, such as scientific measurement and high technology. Atomic Force Microscopy (AFM) opens a new window to the nano-world. It features high resolution in vacuum, gases, or liquid operational environments, and has now become a widely used tool in the sectors of, for example, nano measurement and manipulation, biotech and medical testing, etc. Since the AFM is a very useful nano measurement tool, we have put a lot of effort into this area for many years, including AFM hardware upgrades, control improvements, scan method promotions, and application challenges. So far, we have developed a number of novel AFMs, which include:
有鑑於此、本研究團隊目前專注於AFM系統與技術之開發,目前已成功實現出多套自組式AFM系統 :
- 提出一新型雙探針(Dual Probes)原子力顯微系統用以改善AFM量測失真的問題,此掃描系統可以依據各種樣本輪廓特徵,分別對兩根掃描探針調整一個適合的探針掃描角度,使其可以更準確地還原樣本原始的輪廓特徵,我們也將此精確掃描方法與局部掃描策略結合,使此系統同時具備高速與高精確度的量測要求。
- 考慮AFM量測範圍之限制問題,本研究團隊整合了一自製雷射共軛焦顯微鏡(LSCM)以及長行程平台,並研發合適的演算法來結合兩種顯微鏡,來擴展掃描的範圍(毫米級)並保有一定品質的解析度(奈米級),並且由於LSCM的3D掃描能力,使得整合型顯微鏡有更加廣闊的運用。
- 結合壓縮感知(Compressed sensing)的技術,在保證高解析度的前提下,降低LSCM的掃描樣本數(10%~25%),大幅提高LSCM的掃描速度,進而縮短整合行顯微鏡的掃描時間。
Nano-technology is an important research area in 21st century. There are many relevant applications in civil industry, such as scientific measurement and high technology. Atomic Force Microscopy (AFM) opens a new window to the nano-world. It features high resolution in vacuum, gases, or liquid operational environments, and has now become a widely used tool in the sectors of, for example, nano measurement and manipulation, biotech and medical testing, etc. Since the AFM is a very useful nano measurement tool, we have put a lot of effort into this area for many years, including AFM hardware upgrades, control improvements, scan method promotions, and application challenges. So far, we have developed a number of novel AFMs, which include:
- A novel dual probe AFM developed and combined with an effective tilting angle scan strategy that achieves higher scan accuracy than those with the conventional AFM.
- A novel integrated microscopy combined AFM with CLSM is developed to resolve the short scanning range of AFM and extend the application.
- Combined with compression sensing, the scanning speed of LSCM can increase significantly by reducing the sample data so that the scanning time of integrated microscopy will also decrease.
Journal
- Jim-Wei Wu, Yi-Ting Lin, Yu-Ting Lo, Wei-Chih Liu, Kuang-Yao Chang, Da-Wei Liu, Li-Chen Fu “Effective Tilting Angles for a Dual Probes AFM System to Achieve High-Precision Scanning,” IEEE/ASME Transactions on Mechatronics, vol. 21, no. 5, pp. 2512-2521, (2016) Impact factor: 4.357
- Jim-Wei Wu, Yi-Ting Lin, Yu-Ting Lo, Wei-Chih Liu, and Li-Chen Fu, "Lissajous Hierarchical Local Scan to Increase the Speed of Atomic Force Microscopy," IEEE Transactions on Nanotechnology, vol. 14, no. 5, pp. 810-819, (2015) Impact factor: 1.825
- Jim-Wei Wu, Kuan-Chia Huang, Ming-Li Chiang, Mei-Yung Chen, and Li-Chen Fu, "Modeling and Controller Design of a Precision Hybrid Scanner for Application in Large Measurement-Range Atomic Force Microscopy," IEEE Transactions on Industrial Electronics, vol. 61, no. 7, pp. 3704-3712, (2014) Impact factor: 6.50
- Jim-Wei Wu, Jyun-Jhih Chen, Ming-Li Chiang, Jen-te Yu, and Li-Chen Fu, "Design and Control of Phase-Detection Mode Atomic Force Microscopy for Reconstruction of Cell Contours in Three-Dimensions," IEEE Transactions on Nanotechnology, vol. 13, no. 4, pp. 639-649, (2014) Impact factor: 1.619
- Chih-Lieh Chen, Jim-Wei Wu, Yi-Ting Lin, Li-Chen Fu, and Mei-Yung Chen, "Precision Sinusoidal Local Scan for Large Range Atomic Force Microscopy with Auxiliary Optical Microscopy," IEEE/ASME Transactions on Mechatronics, vol. 20, no. 1, pp. 226-236, (2014) Impact factor: 3.652
Conference
- Wei-Chih Liu, Meng-Hao Chou, Kuang-Yao Chang, Da-Wei Liu, Jim-Wei Wu, and Li-Chen Fu “A Self-Designed Laser Scanning Differential Confocal Microscopy with a Novel Vertical Scan Algorithm for Fast Image Scanning,” Proc. of International Federation of Automatic Control, France, July 9-14, 2017
- Wei-Chih Liu, Da-Wei Liu, Jim-Wei Wu, Kuang-Yao Chang, Meng-Hao Chou, and Li-Chen Fu “Precision Sinusoidal Tracking for Galvanometer scanner with Smith Predictor-based Adaptive Sliding Mode Control,” Proc. of International Automatic Control Conference, Taiwan, Nov. 9-11, 2016
- Yu-Ting Lo, Jim-Wei Wu, Wei-Chih Liu, Da-Wei Liu, Kuang-Yao Chang, and Li-Chen Fu “Adaptive Tilting Angles for a Dual-Probe AFM System to Increase Image Accuracy,” Proc. of 55st IEEE International Conference on Advanced Intelligent Mechatronics, Canada, July 12–15, 2016.
- Jim-Wei Wu, Yu-Ting Lo, Wei-Chih Liu, and Li-Chen Fu, "Lissajous Scan Trajectory with Internal Model Principle Controller for Fast AFM Image Scanning," Proc. of the SICE Annual Conference, Hangzhou, China, July 28-30, 2015.
- Yi-Ting Lin, Yu-Ting Lo, Jim-Wei Wu, Wei-Chih Liu, and Li-Chen Fu, "A Dual Probes AFM System with Effective Tilting Angles to Achieve High-Precision Scanning," Proc. of 53st IEEE Conference on Decision and Control, Los Angeles, California, Dec. 15-17, 2014.
- Chih-Lieh Chen, Jim-Wei Wu, Yi-Ting Li, and Li-Chen Fu, "Precision Sinusoidal Local Scan for Large Range Atomic Force Microscopy with Auxiliary Optical Microscopy," Proc. of 52st IEEE Conference on Decision and Control, Florence, Italy, Dec. 10-13, 2013.
- Jim-Wei Wu, Jyun-Jhih Chen, Kuan-Chia Huang, Chih-Lieh Chen, Yi-Ting Lin, Mei-Yung Chen, and Li-Chen Fu, "Design and Control of Phase-Detection Mode Atomic Force Microscopy for Cells Precision Contour Reconstruction under Different Environments," Proc. of American Control Conference, Washington DC, USA, June 17-19, 2013.
- Kuan-Chia Huang, Jim-Wei Wu, Jyun-Jhih Chen, Chih-Lieh Chen, Mei-Yung Chen, and Li-Chen Fu, "Development of a Large Scanning-range Atomic Force Microscope with Adaptive Complementary Sliding Mode Controller,"Proc. of 51st IEEE Conference on Decision and Control, Hawaii, USA, Dec. 10-13, 2012.
- Jim Wei Wu, Yuan-Zhi Peng, Jyun-Jhih Chen, Kuan-Chia Huang, Mei-Yung Chen, Li-Chen Fu, "Design and Implementation of a Large Measurement-range AFM Scanning System," Proc. of American Control Conference, Montreal, Canada, June 27-29, 2012.
- Yuan-Zhi Peng, Jim-Wei Wu, Kuan-Chia Huang, Jyun-Jhih Chen, Mei-Yung Chen, and Li-Chen Fu, "Design and Implementation of an Atomic Force Microscope with Adaptive Sliding Mode Controller for Large Image Scanning," Proc. of 50th IEEE Conference on Decision and Control, Orlando, Florida, USA, December 12-15, 2011.
- Jim-Wei Wu, Mei-Yung Chen, Shao-Kang Hung, Li-Chen Fu, "A Compact Tapping Mode AFM with Sliding Mode Controller for Precision Image Scanning," Proc. of 8th Asian Control Conference, Kaohsiung, Taiwan, May 15-18, 2011.
- Kuan-Lin Huang, Yuan-Zhi Peng, Jim-Wei Wu, Mei-Yung Chen, and Li-Chen Fu, "Design and Implementation of an Electromagnetically Damped Positioner with Flexure Suspension," Proc. of IEEE Multi-Conference on Systems and Control, Denver, USA, September 28-30, 2011.
- Shan-Tsung Lee, Kuan-Lin Huang, Jim-Wei Wu, and Li-Chen Fu, "Design and Control of Long Travel Range Electromagnetically Actuated Positioning Stage with Application to Precise Machining," Proc. of IEEE Multi-Conference on Systems and Control, pp.2219-2224, Yokohama, Japan, September, 8-10, 2010.
- Shih-Hsun Yen, Jim-Wei Wu, and Li-Chen Fu, "Apply Tapping Mode Atomic Force Microscope with CD/DVD Pickup Head in Fluid," Proc. of American Control Conference, pp. 6549-6554, Baltimore, MD, U.S.A., June 30-July 2, 2010.
Master Thesis
- Kuang-Yao Chang (張光耀),”深度類神經網路實現快速共軛焦雷射掃描顯微鏡縮減隨機取樣影像還原演算法,” Master Thesis, Department of Electrical Engineering, National Taiwan University, R.O.C., 2017
- Da-Wei Liu (劉大瑋),”雷射共軛焦顯微鏡暨原子力顯微鏡之新穎複合系統設計,” Master Thesis, Department of Electrical Engineering, National Taiwan University, R.O.C., 2017
- Wei-Chih Liu (劉韋志), “雷射掃描差動式共軛焦顯微鏡之新穎設計與進階控制,” Master Thesis, Department of Electrical Engineering, National Taiwan University, R.O.C., 2016
- Yu-Ting Lo ( 羅宇廷 ), "自適傾角演算法於高精確雙探針原子力顯微鏡 ," Master Thesis, Department of Electrical Engineering, National Taiwan University, R.O.C., 2015.
- Yi-Ting Lin ( 林奕廷 ), "最適傾角之高精確掃描雙探針原子力顯微鏡系統 ," Master Thesis, Department of Electrical Engineering, National Taiwan University, R.O.C., 2014.
- Chih-Lieh Chen ( 陳志烈 ), "光學顯微鏡輔助之大範圍原子力顯微鏡精密正弦式局部掃描 ," Master Thesis, Department of Electrical Engineering, National Taiwan University, R.O.C., 2013.
- 陳駿智,"應用於細胞三維輪廓重建之相位偵測模式原子力顯微鏡設計與控制 ," Master Thesis, Institute of Electrical Engineering, National Taiwan University, R.O.C., 2012.
- Ming-Chiuan Shiu ( 黃冠嘉 ), "開發一複合式精密掃描平台應用於大範圍掃描量測之原子力顯微鏡 Development of a Precision Hybrid Scanner for Large Measurement-Range Atomic Force Microscopy," Master Thesis, Institute of Electrical Engineering, National Taiwan University, R.O.C., 2012.
- Yuan-Zhi Peng ( 彭元知 ), "設計與控制一精密電磁驅動平台應用於長行程原子力顯微鏡 Design and Control of a Precision Electromagnetic Positioner for Large Measurement-range Atomic Force Microscope,"," Master Thesis, Institude of Electrical Engineering, National Taiwan University, R.O.C., 2011.
- Kuan-Lin Huang ( 黃冠霖 ), "以撓摺機構設計並實現之新型三自由度精密電磁致動平台 ," Master Thesis, Department of Electrical Engineering, National Taiwan University, R.O.C., 2010.
- Shan-Tsung Lee ( 李繕琮 ), "電磁驅動平台於長行程高精度加工之控制與應用 ," Master Thesis, Department of Electrical Engineering, National Taiwan University, R.O.C., 2009.
- 嚴世勳,"新型原子力顯微鏡使用DVD讀取頭在水裡之應用 ," Master Thesis, Institute of Electrical Engineering, National Taiwan University, R.O.C., 2009.
- Chih-Hsien Lin ( 林志憲 ), "新型電磁致動與減震之三自由度撓摺結構精密定位平台/strong> ," Master Thesis, Department of Electrical Engineering, National Taiwan University, R.O.C., 2008.
- 胡琬琳,"以光學讀取頭系統實現之輕敲式液相原子力顯微鏡設計與控制," Master Thesis, Institute of Electrical Engineering, National Taiwan University, R.O.C., 2008.
- Sheng-Chih Huang ( 黃聖智 ), "以磁力與流體之混合機構實現新型六自由度精密定位平臺 A Novel Six-DOF Precision Positioner Utilizing Hybrid Mechanism with Magnetism and Fluid," Master Thesis, Institude of Electrical Engineering, National Taiwan University, R.O.C., 2007.
- 林孟滸,"以光學讀取頭系統實現之輕敲式原子力顯微鏡," Master Thesis, Institude of Electrical Engineering, National Taiwan University, R.O.C., 2006.
- Zhao-Kai Wu ( 吳兆開 ), "以撓褶式機構實現之新型六自由度電磁致動精密定位平臺 A Novel 6-DOF Electromagnetic Precision Positioner Utilizing Flexure Mechanism," Master Thesis, Institude of Electrical Engineering, National Taiwan University, R.O.C., 2006.
- Hsuan-Han Huang ( 黃宣翰 ), "以撓褶式機構設計並實現之新型三自由度電磁致動奈米定位平臺 Design and Implementation of a New 3-DOF Electromagnetic-Nanopositioner Utilizing Flexure Mechanism," Master Thesis, Institude of Electrical Engineering, National Taiwan University, R.O.C., 2005.
- Chia-Feng Tsai ( 蔡嘉峰 ), "整合設計與控制以提升系統強度及定位精度於平面式磁浮系統Integrated Design and Control to Improve Robustness and Upgrade Positioning Precision on a Planar Maglev System," Master Thesis, Institude of Electrical Engineering, National Taiwan University, R.O.C., 2004.
- Tzuo-Bo Lin ( 林佐伯 ), "新型平面式磁浮定位系統之設計、控制與實驗Design, Control, and Experiment of a Novel Planar Maglev Positioning System," Master Thesis, Institude of Electrical Engineering, National Taiwan University, R.O.C., 2003.
- Shin-Guang Huang ( 黃馨廣 ), "新型磁浮精密定位系統之設計、控制與實驗Design Control and Experiment of a Novel Precise Maglev Positioning System," Master Thesis, Institude of Electrical Engineering, National Taiwan University, R.O.C., 2002.
- Ming-Chiuan Shiu ( 許銘全 ), "新型平面式磁浮定位系統之設計與控制Design and Control of a Novel Planar Maglev Positioning System," Master Thesis, Institude of Electrical Engineering, National Taiwan University, R.O.C., 2001.
Dissertation
- Jim-Wei Wu ( 吳俊緯 ), "以利薩茹層疊式局部掃描實現高速大範圍之原子力顯微鏡 ," Ph. D. Dissertation, Department of Electrical Engineering, National Taiwan University, R.O.C., 2013.
- Shao-Kang Hung ( 洪紹剛 ), "新型原子力顯微鏡系統之設計與控制 ," Dissertation, Department of Electrical Engineering, National Taiwan University, R.O.C., 2007.
- Mei-Yung Chen ( 陳美勇 ), "磁浮精密定位系統之分析,模型推導與控制器設計 Analysis, Modeling and Controller Design of a High-Precision Magnetically Levitated Positioning System ," Ph.D. Dissertation, Department of Electrical Engineering, National Taiwan University, R.O.C., 2003.